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Tuesday, December 13, 2016
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8:00 AM
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11:00 PM
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Study Day
- Location: UMass Dartmouth
, 285 Old Westport Road, Dartmouth, MA
- Cost: N/A
- Contact: Registrar's Office
- Description: Today is Study Day.
- Link: http://www.umassd.edu/academiccalendar/
- Topical Areas: Academic Calendar, Academic Calendar - Fall
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3:00 PM
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2016 Employee Service Recognition Ceremony
- Location: Woodland Commons, UMass Dartmouth Campus
, 285 Old Westport Road, Dartmouth, MA 02747
- Contact: Human Resources
- Description: Connect with staff, faculty, family and friends as we celebrate the milestone anniversaries (10 years, 15 years, 20 years, etc) of UMass Dartmouth's many hard working and dedicated employees. The monthly CARES winners will also be honored at this event.
The celebration will precede the Chancellor's Holiday Party on Tuesday, December 13th at 3pm at Woodland Commons.
All are welcome!
- Topical Areas: Faculty, Staff and Administrators
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9:30 AM
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11:30 AM
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Research Component of PhD Qualifier Exam: Guilin Zhao
- Location: Science & Engineering Building, Lester W. Cory Conference Room: Room 213A
- Cost: Free
- Contact: ECE: Electrical & Computer Engineering Department
- Description: TOPIC: RELIABILITY ANALYSIS OF COMPETING SYSTEMS WITH DUAL
EVENTS
LOCATION: Lester W. Cory Conference Room
Science & Engineering Building (SENG), Room 213A
ABSTRACT:
Functional dependence (FDEP) exists in many real-world systems, where the failure of one component (trigger) causes other components (dependent components) within the same system to become inaccessible or unusable. The FDEP behavior complicates the system reliability analysis because it can cause competing failure effects in the time domain. Existing works have assumed non-cascading FDEP, where each system component can be a trigger or a dependent component, but not both. However in practical systems with hierarchical configurations, cascading FDEP takes place where a system component can play a dual role as both a trigger and a dependent component simultaneously. Such a component causes correlations among the different FDEP groups, further complicating the system reliability analysis. In this work, we propose a new combinatorial method for addressing effects of cascading FDEP in the reliability analysis of competing systems with dual events. The method is flexible without limitations on the type of time-to-failure distributions for system components. We perform a detailed case study on a wireless sensor system used in smart home applications to illustrate the proposed methodology.
NOTE: All ECE Graduate Students are ENCOURAGED to attend.
All interested parties are invited to attend. Open to the public.
Advisor: Dr. Liudong Xing
Committee Members: Dr. Honggang Wang, Department of Electrical & Computer Engineering and Dr. Haiping Xu, Department of Computer and Information Science
*For further information, please contact Dr. Liudong Xing at 508.999.8883, or via email at lxing@umassd.edu.
- Topical Areas: General Public, University Community, College of Engineering, Electrical and Computer Engineering
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12:00 PM
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2:00 PM
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Master of Science Thesis Defense: Anusha Krishna Murthy
- Location: Science & Engineering Building, Lester W. Cory Conference Room: Room 213A
- Cost: Free
- Contact: ECE: Electrical & Computer Engineering Department
- Description: TOPIC: RELIABILITY AND COST OF TWO FAILURE MODE SYSTEMS
SUBJECT TO CORRELATED FAILURES AND EXPECTATION CONDITIONAL MAXIMIZATION ALGORITHMS FOR FAILURE COUNT NON-HOMOGENEOUS POISSON PROCESS SOFTWARE RELIABILITY MODELS
LOCATION: Lester W. Cory Conference Room
Science & Engineering Building (SENG), Room 213A
ABSTRACT:
This thesis presents two contributions to the reliability engineering research literature: (i) reliability and cost expressions for systems subject to two modes of failure considering correlated component failures and expressions for reliability and cost optimal designs and (ii) expectation conditional maximization (ECM) algorithms to identify the maximum likelihood estimates (MLE) of nonhomogeneous Poisson process (NHPP) software reliability growth models (SRGM). Contribution (i) extends traditional expressions that assume component failures are independent and identically distributed (IID). Contribution (ii) extend ECM algorithms from failure time to failure count data.
Models to explicitly consider correlation are especially important for two failure modes reliability and cost modeling because the probability of open and closed mode failures are competing constraints that could lead to suboptimal designs when systems are susceptible to correlated failure. Failure count NHPP SRGM are most applicable to the largest and most complex software engineering projects that only record the number of failures observed in a specified interval instead of the individual failure times.
For each of the four two failure mode systems considered, we provide reliability and cost expressions as well as closed-form solutions for reliability and cost optimal designs, examining the impact of correlation in each failure mode on these optimal designs. The ECM algorithm for NHPP SRGM is applied in the context of the Weibull SRGM, which is a flexible and therefore widely applied model.
NOTE: All ECE Graduate Students are ENCOURAGED to attend.
All interested parties are invited to attend. Open to the public.
Advisor: Dr. Lance Fiondella
Committee Members: Dr. Liudong Xing, Department of Electrical & Computer Engineering and Dr. Gaurav Khanna, Physics Department
*For further information, please contact Dr. Lance Fiondella at 508.999.8596, or via email at lfiondella@umassd.edu.
- Topical Areas: General Public, University Community, College of Engineering, Electrical and Computer Engineering
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Today
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12/20
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Winter Move Out Collection
- Location: > See description for location
- Contact: > See Description for contact information
- Description: The Sustainability office is hosting a Winter Move Out Collection where students can donate any unwanted items such as: clothes, non-perishable food, electronics, toys books etc. There will be a bin in each residence hall for students to use during that time.
- Topical Areas: Students
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